• DocumentCode
    1650142
  • Title

    A probabilistic analysis method for functional qualification under Mutation Analysis

  • Author

    Lin, Hsiu-Yi ; Wang, Chun-Yao ; Chang, Shih-Chieh ; Yung-Chih Chen ; Chou, Hsuan-Ming ; Huang, Ching-Yi ; Yang, Yen-Chi ; Shen, Chun-Chien

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2012
  • Firstpage
    147
  • Lastpage
    152
  • Abstract
    Mutation Analysis (MA) is a fault-based simulation technique that is used to measure the quality of testbenches in error (mutant) detection. Although MA effectively reports the living mutants to designers, it suffers from the high simulation cost. This paper presents a probabilistic MA preprocessing technique, Error Propagation Analysis (EPA), to speed up the MA process. EPA can statically estimate the probability of the error propagation with respect to each mutant for guiding the observation-point insertion. The inserted observation-points will reveal a mutant´s status earlier during the simulation such that some useless testcases can be discarded later. We use the mutant model from an industrial EDA tool, Certitude, to conduct our experiments on the OpenCores´ RT-level designs. The experimental results show that the EPA approach can save about 14% CPU time while obtaining the same mutant status report as the traditional MA approach.
  • Keywords
    formal verification; statistical analysis; Certitude EDA tool; OpenCore RT-level design; electronic design automation; error propagation analysis; fault-based simulation technique; functional qualification; functional verification; mutation analysis; observation-point insertion; probabilistic analysis method; register transfer level; testbench quality; Controllability; Estimation; Hardware design languages; IEEE Potentials; Measurement; Probabilistic logic; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176448
  • Filename
    6176448