Title :
Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques
Author :
Aloul, Fadi ; Sagahyroon, Assim ; Al Rawi, Bashar
fDate :
3/8/2006 12:00:00 AM
Keywords :
Circuit faults; Circuit simulation; Combinational circuits; Computer networks; Electrical fault detection; Electronic design automation and methodology; Fault detection; Intelligent networks; Lead; Routing;
Conference_Titel :
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN :
1-4244-0211-5
DOI :
10.1109/AICCSA.2006.205123
