DocumentCode
1650261
Title
Semi-Algorithmic Test Pattern Generation
Author
Shahhoseini, Hadi Shahriar ; Kazerouni, Babak Hosseini
fYear
2006
fDate
3/8/2006 12:00:00 AM
Firstpage
429
Lastpage
432
Keywords
Algorithm design and analysis; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Flow graphs; Logic testing; Reliability engineering; Software testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Systems and Applications, 2006. IEEE International Conference on.
Print_ISBN
1-4244-0211-5
Type
conf
DOI
10.1109/AICCSA.2006.205126
Filename
1618391
Link To Document