• DocumentCode
    1650395
  • Title

    Active load characterization of a microwave transistor for oscillator design

  • Author

    Berini, Pierre ; Ghannouchi, Fadhel M. ; Bosisio, Renato G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ottawa Univ., Ont., Canada
  • Volume
    1
  • fYear
    1997
  • Firstpage
    668
  • Abstract
    This paper describes the use of a six-port active load measurement system to determine the optimal large-signal loading of transistors for the design of microwave oscillators providing maximum output power. Our system has been used to measure the optimal large-signal terminating impedance for a potentially unstable microwave transistor and to apply the device line characterization technique. This technique, which is used to characterize a negative resistance monoport and predict the level of oscillator output power, is implemented for the first time using active loading. An oscillator designed using our measurements generated an output power of 11.3 dBm at a frequency of 3.5 GHz. This result is in good agreement with the value predicted from the device line technique and our measurement system
  • Keywords
    active networks; microwave circuits; microwave oscillators; microwave transistors; multiport networks; negative resistance devices; 3.5 GHz; active load characterization; device line characterization technique; maximum output power; microwave transistor; negative resistance monoport; optimal large-signal loading; optimal large-signal terminating impedance; oscillator design; oscillator output power; six-port active load measurement system; Electrical resistance measurement; Frequency measurement; Impedance measurement; Microwave devices; Microwave measurements; Microwave oscillators; Microwave theory and techniques; Microwave transistors; Power generation; Power measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
  • Conference_Location
    Ottawa, Ont.
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-3747-6
  • Type

    conf

  • DOI
    10.1109/IMTC.1997.604036
  • Filename
    604036