DocumentCode :
1650470
Title :
A polysilicon resistor with an irreversible resistance transition and its application to electrically programmable memory cell
Author :
Petkovic, Dragan M.
Author_Institution :
Elaktronska Industrija, Nis, Yugoslavia
fYear :
1991
Firstpage :
315
Abstract :
An electrically programmable memory cell using a polysilicon resistor with irreversible resistance transition as memory element is proposed. On the basis of the experimental results, the resistor dimensions, doping concentration, and film thickness of polysilicon are determined for the transition voltage and current to 12 V and 20 mA, respectively. The ratio of resistance before and after transition is on the order of 500. A proposed memory cell is fabricated, and an analysis of this cell is given
Keywords :
elemental semiconductors; integrated memory circuits; resistors; silicon; 12 V; 20 mA; current transition; doping concentration; electrically programmable memory cell; film thickness; irreversible resistance transition; polycrystalline Si; polysilicon resistor; resistor dimensions; transition voltage; Aluminum; Conductivity; Doping; Electric resistance; Impurities; Optical microscopy; Resistors; Silicon; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference, 1991. Proceedings., 6th Mediterranean
Conference_Location :
LJubljana
Print_ISBN :
0-87942-655-1
Type :
conf
DOI :
10.1109/MELCON.1991.161840
Filename :
161840
Link To Document :
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