Title :
Sparsity-based single-shot subwavelength coherent diffractive imaging
Author :
Osherovich, Eliyahu ; Shechtman, Yoav ; Szameit, Alexander ; Sidorenko, Pavel ; Bullkich, Elad ; Gazit, Snir ; Shoham, Shy ; Kley, Ernst B. ; Zibulevsky, Michael ; Yavneh, Irad ; Eldar, Yonina C. ; Cohen, Oren ; Segev, Mordechai
Author_Institution :
Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
We present a sparsity-based method for subwavelength coherent diffractive imaging: an algorithmic approach for reconstruction of subwavelength images from a single intensity measurement of their far-field diffraction pattern.
Keywords :
diffraction; image recognition; image resolution; nanostructured materials; far field diffraction pattern; intensity measurement; sparsity based method; subwavelength coherent diffractive imaging; subwavelength image reconstruction; Diffraction; Image reconstruction; Image resolution; Microscopy; Optical diffraction; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
