• DocumentCode
    1650718
  • Title

    Sparsity-based single-shot subwavelength coherent diffractive imaging

  • Author

    Osherovich, Eliyahu ; Shechtman, Yoav ; Szameit, Alexander ; Sidorenko, Pavel ; Bullkich, Elad ; Gazit, Snir ; Shoham, Shy ; Kley, Ernst B. ; Zibulevsky, Michael ; Yavneh, Irad ; Eldar, Yonina C. ; Cohen, Oren ; Segev, Mordechai

  • Author_Institution
    Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present a sparsity-based method for subwavelength coherent diffractive imaging: an algorithmic approach for reconstruction of subwavelength images from a single intensity measurement of their far-field diffraction pattern.
  • Keywords
    diffraction; image recognition; image resolution; nanostructured materials; far field diffraction pattern; intensity measurement; sparsity based method; subwavelength coherent diffractive imaging; subwavelength image reconstruction; Diffraction; Image reconstruction; Image resolution; Microscopy; Optical diffraction; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6325549
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1650718