DocumentCode
1650744
Title
Reconstruction of tightly focused beams using Mie-scattering
Author
Bauer, Thomas ; Orlov, Sergej ; Peschel, Ulf ; Banzer, Peter ; Leuchs, Gerd
Author_Institution
Max Planck Inst. for the Sci. of Light, Erlangen, Germany
fYear
2012
Firstpage
1
Lastpage
2
Abstract
By using a sub-wavelength nano-particle as a field probe and a tailored detection scheme we are able to reconstruct the electric energy density in the focal plane of a high numerical aperture focusing system.
Keywords
Mie scattering; focal planes; image reconstruction; nanoparticles; nanophotonics; optical focusing; Mie-scattering; electric energy density; field probe; focal plane; high numerical aperture focusing; image reconstruction; subwavelength nanoparticle; tailored detection; tightly focused beams; Apertures; Glass; Image reconstruction; Microscopy; Optimized production technology; Probes; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-4673-1839-6
Type
conf
Filename
6325550
Link To Document