DocumentCode
1650855
Title
An analysis of the die testing process using taguchi techniques and circuit diagnostics
Author
Trahan, Robert ; Kiang, Rex
fYear
1995
Firstpage
260
Keywords
Circuit testing; Contact resistance; Design for experiments; Electronic equipment testing; Needles; Phase detection; Pins; Probes; Sockets; Variable structure systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527832
Filename
527832
Link To Document