Title :
An analysis of the die testing process using taguchi techniques and circuit diagnostics
Author :
Trahan, Robert ; Kiang, Rex
Keywords :
Circuit testing; Contact resistance; Design for experiments; Electronic equipment testing; Needles; Phase detection; Pins; Probes; Sockets; Variable structure systems;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527832
