• DocumentCode
    1650860
  • Title

    TP-PPV: Piecewise Nonlinear, Time-Shifted Oscillator Macromodel Extraction For Fast, Accurate PLL Simulation

  • Author

    Lai, Xiaolue ; Roychowdhury, Jaijeet

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN
  • fYear
    2006
  • Firstpage
    269
  • Lastpage
    274
  • Abstract
    We present a novel method for generating small, accurate PLL macromodels that capture transient response and jitter performance with unprecedented accuracy, while offering large speedups. The method extracts and uses a highly accurate oscillator phase macromodel termed the TP-PPV macromodel. The core idea behind the novel extraction procedure is to combine concepts from strongly nonlinear trajectory piecewise macromodeling techniques together with PPV-based time shifted nonlinear phase macromodels. As a result, TP-PPV generated macromodels offer excellent global as well as local fidelity. These properties are necessary for handing large excursions in PLL control voltages during capture/lock in, e.g., hopping frequency synthesizers. We validate TP-PPV on a 5-stage interpolative ring VCO based PLL and compare results against full simulation, as well as against prior macromodels. We show that, unlike prior macromodels that only work well when the control voltage of the VCO has small excursions, the TP-PPV macromodel provides near-perfect matches against full SPICE level simulation over a wide range of design scenarios, while achieving speedups of about three orders of magnitude
  • Keywords
    phase locked loops; voltage-controlled oscillators; PLL macromodel; piecewise nonlinear macromodel; time-shifted oscillator macromodel; Circuit simulation; Clocks; Frequency synthesizers; Jitter; Nonlinear equations; Permission; Phase locked loops; Phase noise; Voltage control; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    1-59593-389-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2006.320147
  • Filename
    4110185