DocumentCode :
1651109
Title :
Leveraging reconfigurability to raise productivity in FPGA functional debug
Author :
Poulos, Zissis ; Yang, Yu-Shen ; Anderson, Jason ; Veneris, Andreas ; Le, Bao
Author_Institution :
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear :
2012
Firstpage :
292
Lastpage :
295
Abstract :
We propose new hardware and software techniques for FPGA functional debug that leverage the inherent reconfigurability of the FPGA fabric to reduce functional debugging time. The functionality of an FPGA circuit is represented by a programming bitstream that specifies the configuration of the FPGA´s internal logic and routing. The proposed methodology allows different sets of design internal signals to be traced solely by changes to the programming bitstream followed by device reconfiguration and hardware execution. Evidently, the advantage of this new methodology vs. existing debug techniques is that it operates without the need of iterative executions of the computationally-intensive design re-synthesis, placement and routing tools. In essence, with a single execution of the synthesis flow, the new approach permits a large number of internal signals to be traced for an arbitrary number of clock cycles using a limited number of external pins. Experimental results using commercial FPGA vendor tools demonstrate productivity (i.e. run-time) improvements of up to 30× vs. a conventional approach to FPGA functional debugging. These results demonstrate the practicality and effectiveness of the proposed approach.
Keywords :
field programmable gate arrays; logic design; program debugging; FPGA fabric reconfigurability; FPGA functional debug; FPGA internal logic; FPGA routing; clock cycles; commercial FPGA vendor tools; computationally-intensive design resynthesis; functional debugging time reduction; hardware techniques; placement tools; programming bitstream; routing tools; software techniques; Benchmark testing; Clocks; Debugging; Field programmable gate arrays; Multiplexing; Shift registers; Table lookup;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176481
Filename :
6176481
Link To Document :
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