1651111

Comparison of product failure rate to the component soft error rates in a multi-core digital signal processor

Zhu, Xiaowei ; Baumann, Rob ; Pilch, Charles ; Zhou, Joe ; Jones, Jason ; Cirba, Claude

Texas Instrum. Inc., Dallas, TX, USA

2005

209

214

SRAM chips; alpha-particle effects; digital signal processing chips; error statistics; failure analysis; flip-flops; neutron effects; semiconductor device reliability; 0.13 micron; DSP product memory; accelerated alpha-particle environments; accelerated neutron environments; charge collection processes; component soft error rates; data state dependence; frequency; latches; memory block size; multi-core digital signal processor; product failure rate; single event upsets; stand-alone SRAM test chip; standard component testing methods; voice-over-packet DSP; Circuit testing; Digital signal processing chips; Digital signal processors; Error analysis; Frequency; Life estimation; Logic testing; Neutrons; Random access memory; Single event upset;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493086

1493086