• DocumentCode
    1651130
  • Title

    Radiation-induced clock jitter and race

  • Author

    Seifert, Norbert ; Shipley, Paul ; Pant, M.D. ; Ambrose, Vinod ; Gill, Balkaran

  • Author_Institution
    Logic Technol. Dev. Q&R, Intel Corp., Hillsboro, OR, USA
  • fYear
    2005
  • Firstpage
    215
  • Lastpage
    222
  • Keywords
    error statistics; flip-flops; hazards and race conditions; integrated circuit reliability; jitter; pulse generators; radiation effects; radiation hardening (electronics); semiconductor device reliability; clock generator; clock nodes; flip flop; hardened pulse generator; hardened pulse latch; pulse latch; radiation-induced clock jitter; radiation-induced race; radiation-induced single event upsets; reliability risk; soft error rate; Clocks; Error analysis; Jitter; Microprocessors; Modems; Neutrons; Pulse generation; Radiation hardening; SPICE; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493087
  • Filename
    1493087
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1651130