DocumentCode
1651149
Title
Run-time power-gating in caches of GPUs for leakage energy savings
Author
Wang, Yue ; Roy, Soumyaroop ; Ranganathan, Nagarajan
Author_Institution
CSE Dept., Univ. of South Florida, Tampa, FL, USA
fYear
2012
Firstpage
300
Lastpage
303
Abstract
In this paper, we propose a novel microarchitectural technique for run-time power-gating caches of GPUs to save leakage energy. The L1 cache (private to a core) can be put in a low-leakage sleep mode when there are no ready threads to be scheduled, and the L2 cache can be put in sleep mode when there is no memory request. The sleep mode is state-retentive, which precludes the necessity to flush the caches after they are woken up. The primary reason for the effectiveness our technique lies in the fact that the latency of detecting cache inactivity, putting a cache to sleep and waking it up before it is accessed, is completely hidden microarchitecturally. The technique incurs insignificant overheads in terms of power and area. Experiments were performed using the GPGPU-Sim simulator on benchmarks that was set up using the CUDA framework. The power and latency modeling of the cache arrays for measuring the wake-up latency and the break-even periods is performed using a 32-nm SOI IBM technology model. Based on experiments on 16 different GPU workloads, the average energy savings achieved by the proposed technique is 54%.
Keywords
cache storage; graphics processing units; memory architecture; parallel architectures; power aware computing; CUDA framework; GPGPU-Sim simulator; L1 cache; L2 cache; SOI IBM technology model; break-even periods; cache array latency modeling; cache array power modeling; cache flushing; cache inactivity detection; leakage energy savings; low-leakage sleep mode; microarchitectural technique; run-time power-gating GPU caches; size 32 nm; wake-up latency measuring; Arrays; Graphics processing unit; Instruction sets; Microarchitecture; Random access memory; Switching circuits; Transistors; GPU; SRAM; cache; leakage power; power-gating;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4577-2145-8
Type
conf
DOI
10.1109/DATE.2012.6176483
Filename
6176483
Link To Document