• DocumentCode
    1651169
  • Title

    Automatic generation of functional models for embedded processor extensions

  • Author

    Sun, Fei

  • Author_Institution
    Tensilica Inc., Santa Clara, CA, USA
  • fYear
    2012
  • Firstpage
    304
  • Lastpage
    307
  • Abstract
    Early architectural exploration and design validation are becoming increasingly important for multi-processor systems-on-chip (MPSoC) designs. Native functional simulations can provide orders of magnitude in speedup over cycle or instruction level simulations but often require dedicated maintenance. In this work, we present a tool called NATIVESIM to automatically generate the functional models for embedded processor extensions. We provide a mechanism to address the challenge of modeling a subset of the processor architecture, with no visibility to the rest of the processor. We illustrate the problem of modeling the processor extensions when the endianness of the target processor is different from the host system and provide a solution to it. Experiments on several benchmark programs indicate that native execution of the target application with the functional models of the processor extensions can achieve large simulation run-time speedup over simulations based on either cycle accurate models (up to 14102× with an average of 3924×) or compiled functional models of an entire processor (up to 103× with an average of 31.6×).
  • Keywords
    embedded systems; integrated circuit design; system-on-chip; MPSoC; NATIVESIM; architectural exploration; automatic generation; benchmark programs; dedicated maintenance; design validation; embedded processor extension; functional models; host system; instruction level simulations; multiprocessor systems-on-chip design; native functional simulations; processor architecture; processor extensions; target application; Computational modeling; Generators; Hardware; Load modeling; Optimization; Prototypes; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176484
  • Filename
    6176484