DocumentCode :
1651188
Title :
A novel method for accurately estimating alpha-induced soft error rates
Author :
Takasu, Ryozo ; Tosaka, Yoshiharu ; Fukuda, Hiroyuki ; Kataoka, Yuji
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fYear :
2005
Firstpage :
230
Lastpage :
233
Keywords :
alpha-particle effects; dosimetry; error statistics; large scale integration; parameter estimation; α-induced soft error rates; α-particle emission; LSI materials; alpha-induced soft error rates; alpha-particle emission; sensitive dosimetry; soft error rate estimation; vacuum α-tracking; Computer errors; Dosimetry; Error analysis; Laboratories; Large scale integration; Life estimation; Materials testing; Neutrons; Optical polymers; Radiation detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Print_ISBN :
0-7803-8803-8
Type :
conf
DOI :
10.1109/RELPHY.2005.1493089
Filename :
1493089
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1651188
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