• DocumentCode
    1651188
  • Title

    A novel method for accurately estimating alpha-induced soft error rates

  • Author

    Takasu, Ryozo ; Tosaka, Yoshiharu ; Fukuda, Hiroyuki ; Kataoka, Yuji

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    2005
  • Firstpage
    230
  • Lastpage
    233
  • Keywords
    alpha-particle effects; dosimetry; error statistics; large scale integration; parameter estimation; α-induced soft error rates; α-particle emission; LSI materials; alpha-induced soft error rates; alpha-particle emission; sensitive dosimetry; soft error rate estimation; vacuum α-tracking; Computer errors; Dosimetry; Error analysis; Laboratories; Large scale integration; Life estimation; Materials testing; Neutrons; Optical polymers; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493089
  • Filename
    1493089
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1651188