1651428

Dynamic thermal laser signal injection microscopy (T-LSIM) on AC propagation failures

Lapierre, Mark ; Falk, R. Aaron

Fairchild Semicond., South Portland, ME, USA

2005

280

285

analogue integrated circuits; digital integrated circuits; failure analysis; fault location; integrated circuit testing; laser beam applications; semiconductor devices; AC failures; AC propagation delay; AC propagation failures; analog device; digital device; dynamic phase delay analysis; dynamic thermal laser signal injection microscopy; elevated resistance detection; failure analysis; fault isolation; internal via; semiconductor devices; Failure analysis; Fault detection; Fault diagnosis; Microscopy; Optical propagation; Propagation delay; Semiconductor devices; Semiconductor lasers; Testing; Thermal resistance;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493099

1493099