1651548

Delay variation mapping induced by dynamic laser stimulation

Sanchez, Kevin ; Deplats, Romain ; Beaudoin, Felix ; Perdu, Philippe ; Lewis, Dean ; Vedagarbha, Praveen ; Woods, Gary

CREDENCE, CNES, Toulouse, France

2005

305

311

CMOS integrated circuits; characteristics measurement; delays; failure analysis; integrated circuit measurement; laser beam applications; CMOS structure characterization; CMOS transistor characteristics; defective IC; delay variation mapping; dynamic laser stimulation; failure analysis; laser assisted device alteration; photoelectric laser stimulation; propagation delay measurement; soft defect localization; thermal laser stimulation; time margin alterations; Delay effects; Laboratories; Laser beams; Laser transitions; Power lasers; Propagation delay; Silicon; Thermal resistance; Vehicle dynamics; Wavelength measurement;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493103

1493103