• DocumentCode
    1652023
  • Title

    Applying asymmetric-stratified data envelopment analysis model for bankruptcy prediction

  • Author

    Kuo, Yi-Chun

  • Author_Institution
    Dept. of Int. Trade, Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The high social costs associated with bankruptcy have spurred searches for better prediction capability. We propose a nonparametric approach for bankruptcy prediction, using data envelopment analysis (DEA) model to identify the boundaries of bankruptcy and non-bankruptcy. The benchmarks of non-bankruptcy and bankruptcy can construct two piecewise frontiers to dominate two convexity classes. Overlap might appear if companies dominated by both frontiers simultaneously, which results in the Type I and Type II errors. The proposed asymmetric-stratified DEA model was applied to find the sequential layers of frontiers. By minimizing the misclassification cost in accordance with different risks and costs of Type I and Type II errors, we identified the optimal layers of frontier to be as separating hyperplane. Based on a sample with equivalent costs of Type I and Type II errors, our approach perform high prediction accuracy with the hit-ratios 94.44% on training and 91.67% on hold-out samples. Iif the proportion of Type II to Type I cost is greater than 10, the results indicate hit-ratio and misclassification cost trade-off to each other. Not alike traditional cut-off value approach used in discriminant analysis, this asymmetric-layering approach can provide more than one alternatives of discriminant hyperplane for bankruptcy prediction in accordance with the institutions´ risk attitude.
  • Keywords
    costing; data envelopment analysis; decision making; statistical analysis; Type I-Type II errors; asymmetric-stratified data envelopment analysis; bankruptcy prediction; discriminant analysis; hyperplane; misclassification cost; social costs; Accuracy; Benchmark testing; Companies; Data envelopment analysis; Data models; Predictive models; Training; bankruptcy prediction; data envelopment analysis (DEA); discriminant; misclassification cost; overlap;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668271
  • Filename
    5668271