Title :
Beyond innovation: Dealing with the risks and complexity of processor design in 22nm
Author :
Anderson, Carl John
Author_Institution :
IBM, Austin, TX, USA
Abstract :
This paper discusses the importance of discipline and risk management in the design of new high performance microprocessors in advanced technologies. Innovation is very important in these designs but the design costs have to be assessed and the risks managed.
Keywords :
CMOS integrated circuits; circuit complexity; integrated circuit design; microprocessor chips; risk management; complexity; discipline management; microprocessors; processor design; risk management; size 22 nm; Bipolar transistor circuits; CMOS logic circuits; Circuit synthesis; Costs; Logic circuits; Microprocessors; Process design; Productivity; Risk management; Technological innovation;
Conference_Titel :
Electron Devices Meeting (IEDM), 2009 IEEE International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-5639-0
Electronic_ISBN :
978-1-4244-5640-6
DOI :
10.1109/IEDM.2009.5424328
