• DocumentCode
    1652074
  • Title

    Characterization of thermoelectric devices in ICs as stimulated by a scanning laser beam

  • Author

    Glowacki, Arkadiusz ; Boit, Christian

  • Author_Institution
    TUB Berlin Univ. of Technol. Sekr. E2, Germany
  • fYear
    2005
  • Firstpage
    450
  • Lastpage
    457
  • Keywords
    Seebeck effect; failure analysis; integrated circuit interconnections; integrated circuit testing; measurement by laser beam; thermoelectric devices; IC failure analysis; OBIRCH; SEI phenomena; Seebeck effect imaging; TLS; bias voltage conditions; constant current condition; constant voltage condition; contacts; interconnects; microelectronics failure analysis; open circuit localization; optical beam induced resistance change; scanning laser beam stimulation; thermal laser stimulation; thermoelectric device characterization; thermoelectric effects; Laser beams; Laser transitions; Optical beams; Optical imaging; Optical materials; Temperature; Thermal resistance; Thermoelectric devices; Thermoelectricity; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493127
  • Filename
    1493127
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1652074