• DocumentCode
    1652092
  • Title

    An architecture-level approach for mitigating the impact of process variations on extensible processors

  • Author

    Kamal, Mehdi ; Afzali-Kusha, Ali ; Safari, Saeed ; Pedram, Massoud

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2012
  • Firstpage
    467
  • Lastpage
    472
  • Abstract
    In this paper, we present an architecture-level approach to mitigate the impact of process variations on extended instruction set architectures (ISAs). The proposed architecture adds one extra cycle to execute custom instructions (CIs) that violate the maximum allowed propagation delay due to the process variations. Using this method, the parametric yield of manufactured chips will greatly improve. The cost is an increase in the cycle latency of some of the CIs, and hence, a slight performance degradation for the extensible processor architectures. To minimize the performance penalty of the proposed approach, we introduce a new merit function for selecting the CIs during the selection phase of the ISA extension design flow. To evaluate the efficacy of the new selection method, we compare the extended ISAs obtained by this method with those selected based on the worst-case delay. Simulation results reveal that a speedup improvement of about 18% may be obtained by the proposed selection method. Also, by using the proposed merit function, the proposed architecture can improve the speedup about 20.7%.
  • Keywords
    instruction sets; parallel architectures; performance evaluation; ISA extension design flow; architecture-level approach; custom instructions; cycle latency; extended instruction set architectures; extensible processor architectures; merit function; performance penalty minimization; process variation impact mitigation; propagation delay; Benchmark testing; Clocks; Delay; Program processors; Propagation delay; Registers; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176516
  • Filename
    6176516