DocumentCode :
1652307
Title :
Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis
Author :
Cai, Yu ; Haratsch, Erich F. ; Mutlu, Onur ; Mai, Ken
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2012
Firstpage :
521
Lastpage :
526
Abstract :
As NAND flash memory manufacturers scale down to smaller process technology nodes and store more bits per cell, reliability and endurance of flash memory reduce. Wear-leveling and error correction coding can improve both reliability and endurance, but finding effective algorithms requires a strong understanding of flash memory error patterns. To enable such understanding, we have designed and implemented a framework for fast and accurate characterization of flash memory throughout its lifetime. This paper examines the complex flash errors that occur at 30-40nm flash technologies. We demonstrate distinct error patterns, such as cycle-dependency, location-dependency and value-dependency, for various types of flash operations. We analyze the discovered error patterns and explain why they exist from a circuit and device standpoint. Our hope is that the understanding developed from this characterization serves as a building block for new error tolerance algorithms for flash memory.
Keywords :
NAND circuits; circuit reliability; error correction codes; flash memories; wear; MLC NAND flash memory error pattern; cycle-dependency error pattern; error correction coding; error tolerance algorithm; flash memory endurance reduction; flash memory reliability reduction; location-dependency error pattern; multilevel cell NAND flash memory error pattern; process technology node; size 30 nm to 40 nm; value-dependency error pattern; wear-leveling; Electric fields; Error analysis; Flash memory; Interference; Logic gates; Programming; Threshold voltage; NAND flash; endurance; error correction; error patterns; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4577-2145-8
Type :
conf
DOI :
10.1109/DATE.2012.6176524
Filename :
6176524
Link To Document :
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