• DocumentCode
    1652618
  • Title

    AC Dynamic Testing of 20bit Sigma-Delta Over-Sampling D/A Converter On a Mixed Signal Test System

  • Author

    Sugai, Masao ; Nakatani, Takayuki

  • fYear
    1992
  • Firstpage
    321
  • Keywords
    Circuit noise; Clocks; Delta-sigma modulation; Jitter; Noise measurement; Noise reduction; Noise shaping; Signal to noise ratio; System testing; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527839
  • Filename
    527839
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1652618