Title :
AC Dynamic Testing of 20bit Sigma-Delta Over-Sampling D/A Converter On a Mixed Signal Test System
Author :
Sugai, Masao ; Nakatani, Takayuki
Keywords :
Circuit noise; Clocks; Delta-sigma modulation; Jitter; Noise measurement; Noise reduction; Noise shaping; Signal to noise ratio; System testing; Working environment noise;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527839
