1652676

Electron trapping and interface trap generation in drain extended pMOS transistors

Moens, P. ; Bauwens, F. ; Nelson, M. ; Tack, M.

AMI Semicond. Belgium BVBA, Oudenaarde, Belgium

2005

555

559

MOSFET; charge injection; electron traps; hot carriers; interface states; DeMOS; charge pumping; drain extended PMOS transistors; electron injection; electron trapping; hot carrier stress; interface trap generation; medium voltage transistors; p-type lateral drain extended MOS; spacer oxide interface trap formation; specific on-resistance degradation; Automotive engineering; Batteries; Charge pumps; Degradation; Electron traps; Hot carriers; MOSFETs; Stress; Transistors; Voltage;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493147

1493147