Title :
Non-solution implications using reverse domination in a modern SAT-based debugging environment
Author :
Le, Bao ; Mangassarian, Hratch ; Keng, Brian ; Veneris, Andreas
Author_Institution :
ECE Dept., Univ. of Toronto, Toronto, ON, Canada
Abstract :
With the growing complexity of VLSI designs, functional debugging has become a bottleneck in modern CAD flows. To alleviate this cost, various SAT-based techniques have been developed to automate bug localization in the RTL. In this context, dominance relationships between circuit blocks have been recently shown to reduce the number of SAT solver calls, using the concept of solution implications. This paper first introduces the dual concepts of reverse domination and non-solution implications. A SAT solver is tailored to leverage reverse dominators for the early on-the-fly detection of bug-free components. These are non-solution areas and their early pruning significantly reduces the the debugging search-space. This process is expedited by branching on error-select variables first. Extensive experiments on tough real-life industrial debugging cases show an average speedup of 1.7x in SAT solving time over the state-of-the-art, a testimony of the practicality and effectiveness of the proposed approach.
Keywords :
VLSI; circuit layout CAD; computability; integrated circuit design; CAD flow; RTL; SAT solver calls; SAT-based debugging environment; VLSI design; automatic bug localization; bug-free components; circuit blocks; debugging search space; dominance relationship; error select variable; industrial debugging; nonsolution implication; on-the-fly detection; reverse domination; Algorithm design and analysis; Clocks; Debugging; Decision trees; Engines; Logic gates; Sequential circuits;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
Conference_Location :
Dresden
Print_ISBN :
978-1-4577-2145-8
DOI :
10.1109/DATE.2012.6176548