DocumentCode
1653023
Title
Online process monitoring scheme for fault detection based on Independent Component Analysis (ICA) and Local Outlier Factor (LOF)
Author
Lee, Jaeshin ; Kang, Bokyoung ; Shin, Kwangsup ; Kang, Sukho
Author_Institution
Dept. of Ind. Eng., Seoul Nat. Univ. (SNU), Seoul, South Korea
fYear
2010
Firstpage
1
Lastpage
6
Abstract
Process monitoring in manufacturing field such as chemistry and pharmacy is valuable to reduce the risk of the accidents and to improve the efficiency of the process. Due to the increased size and complicated technology of the modern plants, computer-aided process monitoring has been introduced. Nevertheless, the existing methods for computer-aided process monitoring such as Multivariate Statistical Process Control (MSPC) based on Principal Component Analysis (PCA) or Independent Component Analysis (ICA) present several limits in accurate fault detection of process. To overcome these limits, we introduce a novel online computer-aided process monitoring scheme based on ICA with Local Outlier Factor (LOF). The proposed scheme adopts LOF as the monitoring statistic. By utilizing LOF, the limits of existing related works using MSPC were successfully resolved. The scheme was tested by widely used benchmark dataset of Tennessee Eastman process. The results showed the effectiveness of the proposed scheme.
Keywords
CAD; computerised monitoring; fault diagnosis; independent component analysis; learning (artificial intelligence); principal component analysis; process monitoring; statistical process control; MSPC; Tennessee Eastman process; computer aided process monitoring; fault detection; independent component analysis; local outlier factor; monitoring statistics; multivariate statistical process control; online process monitoring scheme; principal component analysis; Cooling; Feeds; Mathematical model; Monitoring; Principal component analysis; Process control; Training; ICA; LOF; MSPC; PCA; Tennessee Eastman process; fault detection; online process monitoring;
fLanguage
English
Publisher
ieee
Conference_Titel
Computers and Industrial Engineering (CIE), 2010 40th International Conference on
Conference_Location
Awaji
Print_ISBN
978-1-4244-7295-6
Type
conf
DOI
10.1109/ICCIE.2010.5668311
Filename
5668311
Link To Document