• DocumentCode
    1653123
  • Title

    Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress

  • Author

    Sowariraj, M.S.B. ; De Jong, Peter C. ; Cora, S.M. ; Smedes, Theo ; Mouthaan, A. J Ton ; Kuper, Fred G.

  • Author_Institution
    MESA Res. Inst., Twente Univ., Enschede, Netherlands
  • fYear
    2005
  • Firstpage
    608
  • Lastpage
    609
  • Keywords
    capacitance; capacitors; electric current; electrostatic discharge; semiconductor device models; substrates; CDM stress; ESD; IC circuit design; discharge current path; full chip circuit model; package capacitors; static charge sources; substrate capacitance; Capacitance; Capacitors; Circuit synthesis; Circuit testing; Fault location; Integrated circuit modeling; Integrated circuit packaging; Protection; Stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493166
  • Filename
    1493166
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1653123