Title :
Testing Errors: Data and Calculations in an IC Manufacturing Process
Author :
Williams, Richard H. ; Wagner, R. Glenn ; Hawkins, Charles F.
Keywords :
Circuit testing; Computer errors; Costs; Failure analysis; Frequency estimation; Integrated circuit testing; MOS integrated circuits; Manufacturing processes; Production; Reliability engineering;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527843
