Title :
Board test DFT model for computer products
Author :
Tegethoff, M.V. ; Figal, T.E. ; Hird, S.W.
Keywords :
Assembly; Automatic testing; Computer aided manufacturing; Costs; Design for testability; Investments; Product design; Research and development; Sensitivity analysis; Virtual manufacturing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527845
