• DocumentCode
    1653273
  • Title

    Failure analysis of pixel shorting problems in polymer light emitting diode (PLED) displays

  • Author

    Wu, L. ; Johnson, A. ; Kolosov, D. ; Parker, I. ; Trujillo, J.

  • Author_Institution
    DuPont Displays Inc, Santa Barbara, CA, USA
  • fYear
    2005
  • Firstpage
    618
  • Lastpage
    619
  • Keywords
    LED displays; failure analysis; organic light emitting diodes; reliability; FIB; SEM; display uniformity; driver problems; electrical characterization; excess current; failure analysis; failure mechanisms; optical microscopy; organic light emitting diode displays; pixel shorting problems; pixel shorts; polymer LED displays; polymer light emitting diode displays; reliability problem; Failure analysis; Flat panel displays; Indium tin oxide; Light emitting diodes; Optical buffering; Optical microscopy; Optical polymers; Organic light emitting diodes; Scanning electron microscopy; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493171
  • Filename
    1493171