Title :
On the design of self-checking boundary scannable boards
Author :
Lubaszewski, Marcelo ; Courtois, Bernard
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit testing; Pulp manufacturing; System testing; Transportation;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527846
