Title :
At-speed on-chip diagnosis of board-level interconnect faults
Author_Institution :
Tallinn University of Technology
Keywords :
Fault diagnosis; Testing;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347572
