Title :
Accurate tap-delay measurements using a di .erential oscillation technique
Author :
Petre, O. ; Kerkho, H.G.
Author_Institution :
MESA+Research Institute
Keywords :
CMOS process; CMOS technology; Clocks; Delay; Digital control; Frequency synchronization; Manufacturing; Pins; Semiconductor device measurement; Testing;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347576
