• DocumentCode
    1654039
  • Title

    A framework for simulating hybrid MTJ/CMOS circuits: Atoms to system approach

  • Author

    Panagopoulos, Georgios ; Augustine, Charles ; Roy, Kaushik

  • Author_Institution
    Dept. of ECE, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • Firstpage
    1443
  • Lastpage
    1446
  • Abstract
    A simulation framework that can comprehend the impact of material changes at the device level to the system level design can be of great value, especially to evaluate the impact of emerging devices on various applications. To that effect, we have developed a SPICE-based hybrid MTJ/CMOS (magnetic tunnel junction) simulator, which can be used to explore new opportunities in large scale system design. In the proposed simulation framework, MTJ modeling is based on Landau-Lifshitz-Gilbert (LLG) equation, incorporating both spin-torque and external magnetic field(s). LLG along with heat diffusion equation, thermal variations, and electron transport are implemented using SPICE-in built voltage dependent current sources and capacitors. The proposed simulation framework is flexible since the device dimensions such as MgO thickness and area, are user defined parameters. Furthermore, we have benchmarked this model with experiments in terms of switching current density (JC), switching time (TSWITCH) and tunneling magneto-resistance (TMR). Finally, we used our framework to simulate STT-MRAMs and magnetic flip-flops (MFF).
  • Keywords
    CMOS integrated circuits; SPICE; capacitors; circuit simulation; current density; tunnelling magnetoresistance; LLG equation; Landau-Lifshitz-Gilbert equation; SPICE simulation; SPICE-in built voltage dependent current sources; STT-MRAM; capacitors; electron transport; external magnetic field; heat diffusion equation; hybrid MTJ-CMOS circuit simulation; large scale system design; magnetic flip-flops; magnetic tunnel junction simulator; spin-torque; switching current density; switching time; system level design; thermal variations; tunneling magnetoresistance; Integrated circuit modeling; Magnetic tunneling; Mathematical model; Resistance; SPICE; Semiconductor device modeling; Switches; LLG; MTJ; SPICE; STT-MRAM; simulation framework;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176592
  • Filename
    6176592