1654407

Mechanism of on-current and off-current instabilities under electrical stress in polycrystalline silicon thin-film transistors

De Wang, Shen ; Chang, Tzu Yun ; Lo, Wei Hsiang ; Lei, Tan Fu

Inst. of Electron., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan

2005

702

703

electron traps; elemental semiconductors; hole traps; hot carriers; interface states; semiconductor device reliability; silicon; thin film transistors; Si; TFT; device channel trap states; drain-avalanche-hot-carrier damage; electrical stress; gate oxide trapped charges; interface states; off-current instabilities; on-current instabilities; polycrystalline silicon thin-film transistors; stress-induced device degradation; Circuit synthesis; Degradation; Monitoring; Optical device fabrication; Silicon; Stress measurement; Tellurium; Thermal stresses; Thin film transistors; Voltage;

English

ieee

Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International

0-7803-8803-8

conf

10.1109/RELPHY.2005.1493213

1493213