Title :
Simulation Of an Integrated Design and Test Environment For Mixed Signal Integrated Circuits
Author :
Bateman, Stephen C. ; Kao, William H.
Keywords :
Automatic test equipment; Automatic testing; Circuit testing; Costs; Design engineering; Integrated circuit testing; Mixed analog digital integrated circuits; Performance evaluation; Signal design; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527850
