DocumentCode :
1654595
Title :
Broad-bandwidth THz pulse characterization through electro-optic sampling with narrow-bandwidth probe pulses
Author :
van Tilborg, J. ; Bakker, D.J. ; Matlis, N.H. ; Leemans, W.P.
Author_Institution :
Lawrence Berkeley Nat. Lab., Univ. of California, Berkeley, CA, USA
fYear :
2012
Firstpage :
1
Lastpage :
2
Abstract :
A novel electro-optic THz pulse diagnostic is presented [1]. Experiments are conducted with a 0.11-THz-bandwidth optical probe on a broadband THz source (0-8 THz detection bandwidth) rich in spectral features. The validity and technical details are discussed.
Keywords :
electro-optical devices; optical pulse generation; probes; bandwidth 0 THz to 8 THz; broad-bandwidth THz pulse characterization; broadband THz source; electro-optic THz pulse diagnostic; electro-optic sampling; narrow-bandwidth probe pulses; optical probe; spectral features; Amplitude modulation; Bandwidth; Crystals; Laser beams; Optical imaging; Optical pulses; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
Type :
conf
Filename :
6325696
Link To Document :
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