• DocumentCode
    1654599
  • Title

    Biographies

  • fYear
    2005
  • Firstpage
    716
  • Lastpage
    753
  • Keywords
    Biographies; Electrons; High K dielectric materials; High-K gate dielectrics; MOSFETs; Phase change random access memory; Physics; Random access memory; Read only memory; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
  • Print_ISBN
    0-7803-8803-8
  • Type

    conf

  • DOI
    10.1109/RELPHY.2005.1493220
  • Filename
    1493220
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1654599