Title :
Manufacturing-oriented testing of delay faults in the logic architecture of symmetrical FPGAs
Author :
Girard, Patrick ; Héron, Olivier ; Pravossoudovitch, Serge ; Renovell, Michel
Author_Institution :
Universite Montpellier II
Keywords :
Circuit faults; Circuit testing; Delay; Fault detection; Field programmable gate arrays; Hardware; Logic testing; Manufacturing; Reconfigurable logic; Table lookup;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347602
