DocumentCode
1654708
Title
A STEADY-STATE RESPONSE TEST GENERATION FOR MIXED-SIGNAL INTEGRATED CIRCUITS
Author
Alani, Alaa F. ; Musgrave, G. ; Ambler, A.P.
fYear
1992
Firstpage
415
Keywords
Analog-digital conversion; Circuit testing; Design for testability; Integrated circuit testing; Logic testing; Mixed analog digital integrated circuits; Multiplexing; Signal generators; Steady-state; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527851
Filename
527851
Link To Document