• DocumentCode
    1654717
  • Title

    Probe examination of thickness-shear vibrations of AT-cut natural quartz crystals: some new results

  • Author

    Parshad, R. ; Sharma, Ashok

  • Author_Institution
    Nat. Phys. Lab., New Delhi
  • fYear
    1988
  • Firstpage
    93
  • Lastpage
    94
  • Abstract
    The probe technique of I. Koga and H. Fukuyo (1953) has been used to explore the nature of surface vibrations on unelectroded parts of AT-cut (natural) lapped and etched quartz crystals of dimensions 38×28×0.8 mm3, the length of the crystals having electrodes of two shapes (rectangular and circular) and dimensions (13×10 mm2 and 1.2 cm diameter respectively). The effectiveness of the energy trapping apparently place in such crystals (vibrating in the fundamental mode) has been investigated, and the existence of an asymmetrically located dormant line on the quartz crystal resulting from change of phase of vibrations has been detected
  • Keywords
    crystal resonators; quartz; vibration measurement; 10 to 13 mm; 38 mm; AT-cut natural quartz crystals; SiO2; asymmetrically located dormant line; change of phase of vibrations; circular electrodes; fundamental mode; lapped and etched quartz crystals; new results; probe examination; rectangular electrodes; surface vibrations; thickness-shear vibrations; unelectroded parts; Collision mitigation; Crystals; Electrodes; Etching; Oscilloscopes; Phase detection; Probes; Shape; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
  • Conference_Location
    Baltimore, MD
  • Type

    conf

  • DOI
    10.1109/FREQ.1988.27585
  • Filename
    27585