DocumentCode
1654717
Title
Probe examination of thickness-shear vibrations of AT-cut natural quartz crystals: some new results
Author
Parshad, R. ; Sharma, Ashok
Author_Institution
Nat. Phys. Lab., New Delhi
fYear
1988
Firstpage
93
Lastpage
94
Abstract
The probe technique of I. Koga and H. Fukuyo (1953) has been used to explore the nature of surface vibrations on unelectroded parts of AT-cut (natural) lapped and etched quartz crystals of dimensions 38×28×0.8 mm3, the length of the crystals having electrodes of two shapes (rectangular and circular) and dimensions (13×10 mm2 and 1.2 cm diameter respectively). The effectiveness of the energy trapping apparently place in such crystals (vibrating in the fundamental mode) has been investigated, and the existence of an asymmetrically located dormant line on the quartz crystal resulting from change of phase of vibrations has been detected
Keywords
crystal resonators; quartz; vibration measurement; 10 to 13 mm; 38 mm; AT-cut natural quartz crystals; SiO2; asymmetrically located dormant line; change of phase of vibrations; circular electrodes; fundamental mode; lapped and etched quartz crystals; new results; probe examination; rectangular electrodes; surface vibrations; thickness-shear vibrations; unelectroded parts; Collision mitigation; Crystals; Electrodes; Etching; Oscilloscopes; Phase detection; Probes; Shape; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location
Baltimore, MD
Type
conf
DOI
10.1109/FREQ.1988.27585
Filename
27585
Link To Document