DocumentCode :
1654717
Title :
Probe examination of thickness-shear vibrations of AT-cut natural quartz crystals: some new results
Author :
Parshad, R. ; Sharma, Ashok
Author_Institution :
Nat. Phys. Lab., New Delhi
fYear :
1988
Firstpage :
93
Lastpage :
94
Abstract :
The probe technique of I. Koga and H. Fukuyo (1953) has been used to explore the nature of surface vibrations on unelectroded parts of AT-cut (natural) lapped and etched quartz crystals of dimensions 38×28×0.8 mm3, the length of the crystals having electrodes of two shapes (rectangular and circular) and dimensions (13×10 mm2 and 1.2 cm diameter respectively). The effectiveness of the energy trapping apparently place in such crystals (vibrating in the fundamental mode) has been investigated, and the existence of an asymmetrically located dormant line on the quartz crystal resulting from change of phase of vibrations has been detected
Keywords :
crystal resonators; quartz; vibration measurement; 10 to 13 mm; 38 mm; AT-cut natural quartz crystals; SiO2; asymmetrically located dormant line; change of phase of vibrations; circular electrodes; fundamental mode; lapped and etched quartz crystals; new results; probe examination; rectangular electrodes; surface vibrations; thickness-shear vibrations; unelectroded parts; Collision mitigation; Crystals; Electrodes; Etching; Oscilloscopes; Phase detection; Probes; Shape; Transistors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
Type :
conf
DOI :
10.1109/FREQ.1988.27585
Filename :
27585
Link To Document :
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