Title :
Rigorous analysis of bistable memory in silica toroid microcavity
Author :
Yoshiki, Wataru ; Tanabe, Takasumi
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
We modeled nonlinear behavior in a silica toroid microcavity using coupling mode theory and the finite element method, and obtained Kerr bistability that did not suffer from the thermo-optic effect by optimizing the fiber-cavity coupling.
Keywords :
finite element analysis; microcavities; optical Kerr effect; silicon compounds; thermo-optical effects; Kerr bistability; bistable memory; coupling mode theory; fiber-cavity coupling; finite element method; nonlinear behavior; rigorous analysis; silica toroid microcavity; thermooptic effect; Absorption; Cavity resonators; Finite element methods; Microcavities; Optical bistability; Optical fibers; Silicon compounds;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
