Title :
2003 Paper Awards: Best Paper Award
Abstract :
The 2003 Best Paper Award was presented to Muhammad A. Alam and R. Kent Smith for "A phenomenological theory of c??rrelated multiple soft-breakdown events in ultra-thin gate dielectrics."
Conference_Titel :
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-8803-8
DOI :
10.1109/RELPHY.2005.1493225
