DocumentCode
1654753
Title
2003 Paper Awards: Best Paper Award
fYear
2005
Firstpage
760
Lastpage
760
Abstract
The 2003 Best Paper Award was presented to Muhammad A. Alam and R. Kent Smith for "A phenomenological theory of c??rrelated multiple soft-breakdown events in ultra-thin gate dielectrics."
Keywords
Awards;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7803-8803-8
Type
conf
DOI
10.1109/RELPHY.2005.1493225
Filename
1493225
Link To Document