Title :
Functionalization of suspended carbon nanotubes in silicon microsystems by Atomic Layer Deposition (ALD)
Author :
Aasmundtveit, Knut E. ; Ta, Bao Q. ; Ngo, Anh V. ; Nilsen, Ola ; Hoivik, Nils
Author_Institution :
IMST - Dept. of Micro & Nano Syst. Technol., HBV - Buskerud & Vestfold Univ. Coll., Borre, Norway
Abstract :
Carbon Nanotubes (CNTs) can be used as gas sensing elements when combined with electronic circuitry. The method of direct integration on free-standing microbridges allows CNT-to-silicon integration in a CMOS-compatible process that can be automated and scaled to wafer level. Sensitive gas sensors can thus be made in single chips containing both the electronics and the nanomaterial functionality. The present work explores functionalization of suspended CNTs from the direct integration method, using Atomic Layer Deposition (ALD), with the purpose of improving selectivity and sensitivity of gas sensors. Three wide-bandgap semiconducting oxides (ZnO, TiO2 and Co3O4) are successfully deposited, where the resulting structures reflect the reactivity of the different ALD precursors. The work further demonstrates the potential this functionalization scheme has for greatly reducing the electrical resistance of the resulting Si-CNT-Si system.
Keywords :
CMOS integrated circuits; atomic layer deposition; carbon nanotubes; cobalt compounds; elemental semiconductors; micromechanical devices; sensitivity; silicon; titanium compounds; zinc compounds; ALD precursors; CMOS-compatible process; CNT; Co3O4; Si; TiO2; ZnO; atomic layer deposition; direct integration method; electrical resistance; electronic circuitry; free-standing microbridges; functionalization scheme; nanomaterial functionality; reactivity; selectivity; sensitive gas sensors; sensitivity; suspended carbon nanotubes; wafer level; wide-bandgap semiconducting oxides; Carbon nanotubes; Gas detectors; Nanoparticles; Silicon; Zinc oxide;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location :
Toronto, ON
DOI :
10.1109/NANO.2014.6967985