• DocumentCode
    1654884
  • Title

    Reli: Hardware/software Checkpoint and Recovery scheme for embedded processors

  • Author

    Li, Tuo ; Ragel, Roshan ; Parameswaran, Sri

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2012
  • Firstpage
    875
  • Lastpage
    880
  • Abstract
    Checkpoint and Recovery (CR) allows computer systems to operate correctly even when compromised by transient faults. While many software systems and hardware systems for CR do exist, they are usually either too large, require major modifications to the software, too slow, or require extensive modifications to the caching schemes. In this paper, we propose a novel error-recovery management scheme, which is based upon re-engineering the instruction set. We take the native instruction set of the processor and enhance the microinstructions with additional micro-operations which enable checkpointing. The recovery mechanism is implemented by three custom instructions, which recover the registers which were changed, the data memory values which were changed and the special registers (PC, status registers etc.) which were changed. Our checkpointing storage is changed according to the benchmark executed. Results show that our method degrades performance by just 1.45% under fault free conditions, and incurs area overhead of 45% on average and 79% in the worst case. The recovery takes just 62 clock cycles (worst case) in the examples which we examined.
  • Keywords
    cache storage; checkpointing; embedded systems; fault diagnosis; instruction sets; Reli; caching schemes; checkpointing storage; computer systems; custom instructions; data memory values; embedded processors; error-recovery management scheme; fault free conditions; hardware-software checkpoint and recovery scheme; instruction set; microinstructions; microoperations; transient faults; Checkpointing; Clocks; Hardware; Optimization; Program processors; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4577-2145-8
  • Type

    conf

  • DOI
    10.1109/DATE.2012.6176621
  • Filename
    6176621