Title :
User-constrained test architecture design for modular SOC testing
Author :
Krundel, Ludovic ; Goel, Sandeep Kumar ; Marinissen, Erik Jan ; Flottes, Marie-Lise ; Rouzeyre, Bruno
Author_Institution :
Philips Research Laboratories
Keywords :
Automatic testing; Computer architecture; Constraint optimization; Cost function; Design optimization; Digital integrated circuits; Integrated circuit testing; Laboratories; Minimization methods; Wires;
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Print_ISBN :
0-7695-2119-3
DOI :
10.1109/ETSYM.2004.1347611
