• DocumentCode
    1654972
  • Title

    A method for calculating average run length by the use of Markov Chain

  • Author

    Hojjati, Seyed Mohammad Hossein

  • Author_Institution
    Dept. of Ind. Engineerig, Islamic Azad Univ., Shiraz, Iran
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This study is concerned with the development of a methodology for finding the mean action time (or average run length) for the general chart with different zonings, one standard deviation apart, as a function of the changes in the process being controlled. In this methodology we have used the properties of finite state Markov Chain, and the important steady state equations. We considered six states for the transition matrix of the Markov Chain for calculation of ARL. These states were considered as the different zones of the control chart. By the comparison of the run sum control chart with Shewhart and warning limit chart we concluded that the RS control chart has a sensitivity advantage over the other charts in the main range of the shift of the process mean. So to prevent loss of profit form defects in the quality of production we may recommend use of the run sum approach with a small value for the action limit. This approach can be used for most of the factories which are using around the 3σ quality assurance.
  • Keywords
    Markov processes; control charts; quality assurance; 3σ quality assurance; RS control chart; average run length; finite state Markov Chain; mean action time; one standard deviation; run sum approach; run sum control chart; steady state equations; transition matrix; warning limit chart; Control charts; Equations; Markov processes; Mathematical model; Process control; Steady-state; Average Run Length; Markov Chain; Quality; Run Sum;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Industrial Engineering (CIE), 2010 40th International Conference on
  • Conference_Location
    Awaji
  • Print_ISBN
    978-1-4244-7295-6
  • Type

    conf

  • DOI
    10.1109/ICCIE.2010.5668384
  • Filename
    5668384