DocumentCode :
1654980
Title :
HIGH PERFORMANCE MONOLITHIC VERNIERS FOR VLSI AUTOMATIC TEST EQUIPMENT
Author :
Necoechea, R. Warren
fYear :
1992
Firstpage :
422
Keywords :
Adders; Automatic test equipment; Clocks; Costs; Flip-flops; Frequency; Propagation delay; Ring oscillators; Timing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527852
Filename :
527852
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1654980