Title :
Profile control on solar parabolic troughs
Author :
Sansoni, P. ; Fontani, D. ; Francini, F. ; Mercatelli, L. ; Jafrancesco, D. ; Sani, E.
Author_Institution :
INO (Nat. Inst. of Opt.), Florence, Italy
Abstract :
Linear parabolic collectors usually need profilometric control since the reflector surface can be imperfectly manufactured. Optical profile assessment is generally addressed to detect small localised defects. The paper proposes two optical devices that were developed simulating profile measurements on linear parabolic mirrors. Solar troughs are employed in thermal plants and concentrating photovoltaic systems. The profilometer examines the reflector surface operating on a plane transversal to the linear axis of the trough collector. Then the detection is repeated displacing the optical device along the linear collector axis. The first profilometer includes a source of parallel rays and a target placed at the collector focal distance. The second profilometer has a fixed target and a linear source, which is approximately located in the focal position of the solar mirror. Ray-tracing simulations and practical tests are illustrated for both optical devices.
Keywords :
mirrors; optical testing; ray tracing; solar absorber-convertors; solar cells; solar control films; surface topography measurement; collector focal distance; concentrating photovoltaic systems; focal position; linear collector axis; linear parabolic collectors; linear parabolic mirrors; linear source; optical devices; optical profile assessment; parallel ray source; plane transversal; practical tests; profile measurements; profilometer; profilometric control; ray-tracing simulations; reflector surface; small localised defects; solar mirror; solar parabolic troughs; target; thermal plants; trough collector; Geometrical optics; Measurement by laser beam; Mechanical variables measurement; Mirrors; Optical reflection; Optical variables measurement; Optical Metrology; Profolometry; Solar Energy;
Conference_Titel :
Photonics Technologies, 2014 Fotonica AEIT Italian Conference on
Conference_Location :
Naples
Print_ISBN :
978-8-8872-3718-4
DOI :
10.1109/Fotonica.2014.6843911