• DocumentCode
    1655235
  • Title

    A new BIST scheme for 5GHz low noise amplifiers

  • Author

    Ryu, Jee-Youl ; Kim, Bruce C. ; Sylla, Iboun

  • Author_Institution
    Arizona State University
  • fYear
    2004
  • Firstpage
    127
  • Lastpage
    132
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Costs; Low-noise amplifiers; Noise figure; Noise measurement; Radio frequency; Radiofrequency integrated circuits; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
  • Print_ISBN
    0-7695-2119-3
  • Type

    conf

  • DOI
    10.1109/ETSYM.2004.1347625
  • Filename
    1347625
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1655235